PROGRAM

Technical Program

From 29 September until 2 October 2026

    • Basic Mechanisms
    • Radiation Effects in Devices and ICs
    • Single Event Effects: Mechanisms and Modeling
    • Single Event Effects in Devices and ICs
    • Hardness Assurance
    • Facilities and Dosimetry
    • Radiation Hardening by Design
    • Radiation effects in Photonic Devices
    • Environments
    • Effects in Complex Devices and Systems