Technical Committee

Sessions

A: SEE Mechanisms and modelling

B: SEE Devices and ICs

C: Photonics, Optoelectronics and Sensors

D: Radiation effects in devices and ICs

E: Radiation effects in complex devices and Systems

F: Radiation hardening techniques

G: Dosimetry and Facilities

H: Basic Mechanisms

I: Radiation environments

J: Radiation hardness assurance

DW: Data workshop

P: Poster

Co-chair

Mike King
Intel - USA

Pierre Garcia
TRAD - France

Ali Jouni
Sodern - France

Chen Li
Univ. Saskatchewan - Canada

Alejandro Urena
ONERA - France

Florence Malou
CNES - France

Camille Bélanger-Champagne
TRIUMF - Canada

Rosine Coq Germanicus
University Caen - France

Cesar Boatella Polo
ESA - Nederland

Roberta Mancini
Thales Alenia Space - Italy

Steve Witczak
Northrop Grumman Corporation - USA

Marta Bagatin
University of Padova, Italy

Co-chair

Victor Malherbe
STMicro - France

Bharat Bhuva
University Vanderbilt - USA

Jochen Kuhnhenn
Fraunhofer - Germany

Corinna Martinella
University Zurich - Switzerland

Paolo Rech
University Trento - Italy

Fernanda Lima Kastensmidt
University of Porto Alegre - Brazil

Christoph Tscherne
Seibersdorf Laboratories - Austria

Ian Dawson
Queen Mary London)

Stuart George
NASA

Marc Poizat
ESA - Nederland

Peter Svihra
FJFI CTU in Prague

AIan Owens
former ESA - Nederland